Many applications require more than one sensor type to deliver optimum inspection and sorting results. Our expertise lies in developing smart solutions for your application and offering a broad range of technologies to serve your needs:
All our classification systems are based on the EVK proprietary data processing unit and allow different sensors to be combined easily.
Contact us to support you with defining your solution including:
- HELIOS: Hyperspectral imaging line scan system
- EOS: Color line scan system
- ARGOS: Conductive imaging line scan system
- Third party line scanner with GigE vision interface