EVK Helios EQ32
The EVK HELIOS EQ32 is a hyperspectral imaging camera with an integrated classification system. This powerful analysis system is based on non-contact and non-destructive short-wavelength infrared imaging spectroscopy.
The EVK HELIOS system analyses chemical properties of objects and makes distinction of material types not visible to color cameras. The internal processing engine delivers qualitative and quantitative information of material streams e.g. analyte concentrations or material compositions. The camera convinces as a spatially resolved real-time measurement system with powerful data processing and high-precision signal processing for analytical, industrial applications.
Hyperspectral Camera with Integrated Classification System
EVK HELIOS EQ32, a measuring system specially designed for industrial working conditions, has been created in close cooperation with partners from the mechanical and plant engineering industry. Due to the stable optomechanical design for real industrial temperature conditions, machine designs and fields of application, as well as data processing and algorithms specially developed for analytics, EVK HELIOS EQ32 enables an optimized analysis directly in the process line.
Spatial Resolution in Real-Time
The workflow in which the system is configured, chemometric models are created and transferred with the help of the software EVK SQALAR, is seamless. The evaluation takes place completely in the EVK HELIOS EQ32 system, whereby no external evaluation systems are required. However, a connection to already existing evaluation systems is easily possible via GigE Vision and GenICam. EVK HELIOS EQ32 is equipped with 320 spatial sensor resolution, measures in the wavelength range of 930 - 1700nm and thereby scans with a frame rate of 446Hz full frame.
Customers are supported by the EVK Professional Services team from application development to the fully integrated Helios EQ32 system on-site. EVK thus enables the integration of state-of-the-art real-time analysis systems in the shortest possible time in order to successfully equip processing lines for the future and thus exploit the full potential of the applications.
- Spectral range in near infrared (NIR) and short-wavelength infrared (SWIR): 930 nm to 1700 nm
- Scan rate of 446 Hz full spectra (248 spectral bands) up to 3.8 kHz using ROI
GigE Vision/ GenICam interface
Rugged, industrial design. Protection rating IP54
Temperature range 0°C to 50°C with full optical stability
System optimized for analytic applications
Seamless integration with EVK SQALAR software suite
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EVK HELIOS EQ32 – Product brief
EVK HELIOS EQ32 – Data sheet
of our applications
Together with the EVK SQALAR analysis software, it is possible to record data efficiently and easily and to create chemometric models with it. The optimized and user-friendly application allows flexible and fast development of applications, minimizing development time and making the process economically effective. The EVK STREAM Supervisor is used for multi-point monitoring of industrial material flows.
In addition, the EVK ABAS inductive metal sensor provides spatially resolved information about conductive material in the product stream and can thus reliably detect ferrous and non-ferrous metal particles and transmit the command to sort them out.