EVK Helios EC32
The EVK HELIOS EC32 is a hyperspectral core camera, delivering optically corrected and spatially resolved spectral data. The line-scan camera features non-contact and non-destructive short-wavelength imaging spectroscopy for real-time identification of material types in industrial applications.
Equipped with 320 pixels spatial sensor resolution, EVK HELIOS EC32 measures in the wavelength range of 930 nm to 1700 nm and thereby scans with a frame rate of 446 Hz full spectra. A connection to the EVK ALPHA data processing systems is possible via GigE Vision/ GenICam.
In combination with the real-time image processing platform EVK ALPHA, the EVK HELIOS EC32 camera features a powerful system for in-line analysis and monitoring of product streams in a range of industries.
Hyperspectral Core Camera
The EVK HELIOS EC32 is a hyperspectral core camera with optically corrected spectral data output and a spatial sensor resolution of 320 pixels.
This line scan camera was specifically developed for flexible use in industrial applications. The combination with the modular concept of the EVK ALPHA offers the flexibility to easily add or replace required modules.
Value Statements
Hyperspectral Imaging Camera
for in-line operations in real-time
Internal Camera Calibration
optically corrected output data, no external calibration necessary
Interface Standard
GigE Vision and GenICam compliant
Excellent Signal-to-Noise Ratio
SNR of 3.500 at a nominal spatial resolution of 320 pixels
Rugged, Industrial Design
ideal for industrial applications
FROM APPLICATION DEVELOPMENT TO FULL INTEGRATION
Customers are supported by the EVK Professional Services team from application development to the fully integrated EVK HELIOS EC32 system on-site. EVK thus enables the integration of state-of-the-art real-time analysis systems in the shortest possible time in order to successfully equip processing lines for the future and thus exploit the full potential of the applications.
Technical Details
- Spectral range in near infrared (NIR) and short-wavelength infrared (SWIR): 930 nm to 1700 nm
- Scan rate of 446 Hz full spectra (248 spectral bands) up to 3.8 kHz using ROI
GigE Vision/ GenICam interface
Rugged, industrial design. Protection rating IP54
Temperature range 0°C – 45°C with full optical stability
Suitable for in-line classification, metrology, and sorting (in combination with EVK ALPHA)
Typical combinations
of our applications
Complemented by the real-time image processing platform EVK ALPHA and proprietary algorithms, the EVK HELIOS EC32 enables reliable detection of foreign bodies and extracts valuable key data for inspection and monitoring, as well as for precise sorting commands.
The software EVK SQALAR enables the efficient creation of chemometric models. The optimized and user-friendly application enables flexible and fast development of applications, minimizing development time and making the process economically effective. The EVK STREAM Supervisor is used for multi-point monitoring of industrial material flows.
In addition, the EVK ABAS inductive metal sensor provides spatially resolved information about conductive material in the product stream and can thus reliably detect ferrous and non-ferrous metal particles and transmit the command to sort them out.