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EVK Helios EQ32

The EVK Helios EQ32 is a powerful analysis system, based on non-contact and non-destructive infrared imaging spectroscopy.

The camera convinces as a spatially resolved real-time measurement system with powerful data processing and high-precision signal processing for analytical, industrial applications.

Helios EQ32, a measuring system specially designed for industrial working conditions, has been created in close cooperation with partners from the mechanical and plant engineering industry. Due to the stable optomechanical design for real industrial temperature conditions, machine designs and fields of application, as well as data processing and algorithms specially developed for analytics, Helios EQ32 enables an optimized analysis directly in the process line.

EVK Helios EQ32

Spatial resolution in real time

The workflow in which the system is configured, chemometric models are created and transferred with the help of the EVK software SQALAR, is seamless. The evaluation takes place completely in the Helios EQ32 system, whereby no external evaluation systems are required. However, a connection to already existing evaluation systems is easily possible via GigE Vision/GenICam and Camera Link. Helios EQ32 is equipped with 312 effective pixels spatial resolution, measures in the wavelength range of 930 - 1700nm and thereby scans with a frame rate of 446Hz full frame.

Customers are supported by the EVK Professional Services team from application development to the fully integrated Helios EQ32 system on-site. EVK thus enables the integration of state-of-the-art real-time analysis systems in the shortest possible time in order to successfully equip processing lines for the future and thus exploit the full potential of the applications.

Core Features

Operates in Near Infrared (NIR) wavelength range from 0.93 - 1.70 nm

Spatial resolution of 312 effective pixels

500 Hz acquisition speed at 220 spectral pixels

GigE Vision GenICam interface

Rugged industrial design. Protection rating IP54

Temperature Range 0°C - 50°C with full optical stability

Optical system optimized for analytic applications

Seamless integration with EVK SQALAR software suite

 

Downloads

EVK Helios EQ32 product brief
EVK Helios EQ32 analysis system
pdf
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